The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Nov. 28, 2018
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Tetsuhei Kobayashi, Tokyo, JP;
Sho Onodera, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
A measurement system is for measuring positions of a plurality of subjects by using an ultrasonic testing sensor. The measurement system includes an ideal arcuate waveform creation unit configured to create, for each of the subjects, an ideal arcuate waveform of a measurement result of the ultrasonic testing sensor based on machining position information on the subject; a measurement arcuate waveform creation unit configured to create a measurement arcuate waveform based on the measurement result; a position estimation unit configured to collate the ideal arcuate waveform and the measurement arcuate waveform with each other to estimate a position of the subject from the measurement arcuate waveform determined to correspond to any ideal arcuate waveform; and an antiphase waveform addition unit configured to add, to the measurement arcuate waveform, a waveform in antiphase to the measurement arcuate waveform with which the position of the subject has been estimated.