The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Feb. 02, 2018
Applicant:
The Boeing Company, Chicago, IL (US);
Inventors:
Taisia Tsukruk Lou, Olivette, MO (US);
Donald Duane Palmer, Jr., Ballwin, MO (US);
Nathan Rylan Smith, Melbourne, FL (US);
Shayne Andrew Dorrell, St. Louis, MO (US);
Assignee:
The Boeing Company, Chicago, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/30 (2017.01); G01N 21/3581 (2014.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B22F 3/105 (2006.01); B33Y 50/00 (2015.01); B33Y 40/00 (2020.01); B33Y 50/02 (2015.01); B29C 64/153 (2017.01); B29C 64/393 (2017.01); G01N 21/3563 (2014.01); B29C 64/386 (2017.01);
U.S. Cl.
CPC ...
B29C 64/30 (2017.08); B22F 3/1055 (2013.01); B29C 64/153 (2017.08); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 40/00 (2014.12); B33Y 50/00 (2014.12); B33Y 50/02 (2014.12); G01N 21/3563 (2013.01); G01N 21/3581 (2013.01); B22F 2003/1057 (2013.01); B29C 64/386 (2017.08);
Abstract
Apparatuses and systems comprising an additive manufacturing device and an associated terahertz inspection device for inspecting additively deposited layers in real time during or immediately following material deposition and parts made and inspected by the apparatuses and systems and their associated methods are disclosed herein.