The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2020

Filed:

Mar. 13, 2013
Applicants:

Robert Nering, Stockton, NJ (US);

Elias N. Shalhoub, Cranston, RI (US);

Inventors:

Robert Nering, Stockton, NJ (US);

Elias N. Shalhoub, Cranston, RI (US);

Assignee:

Ethicon, Inc., Somerville, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 17/32 (2006.01); A61B 17/34 (2006.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 17/32002 (2013.01); A61B 2017/320024 (2013.01); A61B 2017/3492 (2013.01); A61B 2090/033 (2016.02);
Abstract

Disclosed is an infinitely adjustable depth stop for a laparascopic instrument having a shaft, the depth stop including a first component having a first annular space adapted to allow the shaft to be fitted therethrough. The first annular space has a reducible diameter and an interference surface against which the shaft may be fitted. Upon reduction of the reducible diameter, the interference surface frictionally engages the shaft to arrest relative movement of the depth stop along the shaft. The frictional engagement may be along a curve, a spiral curve, or an area. Means are also provided to reopen the reducible diameter to release the depth stop.


Find Patent Forward Citations

Loading…