The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2020

Filed:

Jul. 24, 2018
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Seung-hoon Kim, Suwon-si, KR;

Si-won Park, Suwon-si, KR;

Hye-kyoung Hong, Seoul, KR;

Jin-beom Hong, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/08 (2006.01); A61B 6/00 (2006.01); A61B 6/06 (2006.01); G21K 1/04 (2006.01);
U.S. Cl.
CPC ...
A61B 6/54 (2013.01); A61B 6/06 (2013.01); A61B 6/544 (2013.01); A61B 6/08 (2013.01); A61B 6/467 (2013.01); A61B 6/588 (2013.01); G21K 1/046 (2013.01);
Abstract

An X-ray apparatus includes a collimator comprising a lamp and configured to adjusting an irradiation region of X-rays radiated from an X-ray source; an image acquirer configured to acquire an object image by imaging an object while the lamp is turned on; and a controller configured to acquire an object distance based on the object image and acquire a thickness of the object based on a detector distance and the object distance. The object distance is a distance between the X-ray source and the object, and the detector distance is a distance between the X-ray source and an X-ray detector.


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