The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Jul. 10, 2017
Shimadzu Corporation, Kyoto, JP;
Osaka University, Suita-shi, JP;
Satoshi Sano, Kyoto, JP;
Koichi Tanabe, Kyoto, JP;
Toshinori Yoshimuta, Kyoto, JP;
Kenji Kimura, Kyoto, JP;
Hiroyuki Kishihara, Kyoto, JP;
Yukihisa Wada, Kyoto, JP;
Takuro Izumi, Kyoto, JP;
Taro Shirai, Kyoto, JP;
Takahiro Doki, Kyoto, JP;
Akira Horiba, Kyoto, JP;
Takayoshi Shimura, Osaka, JP;
Heiji Watanabe, Osaka, JP;
Takuji Hosoi, Suita, JP;
Shimadzu Corporation, Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto-shi, Kyoto, JP;
OSAKA UNIVERSITY, Yamadaoka, Suita-shi, Osaka, JP;
Abstract
This X-ray phase contrast imaging apparatus () includes an X-ray source () that radiates continuous X-rays, a first grating () that forms a self-image, a second grating (), a detector () that detects the continuous X-rays, and a third grating () arranged between the detector () and the first grating. The first grating (), the second grating (), and the third grating () are arranged so as to satisfy conditions of predetermined formulas.