The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2020

Filed:

Oct. 19, 2016
Applicant:

Topcon Corporation, Itabashi-ku, Tokyo, JP;

Inventor:

Yoshikiyo Moriguchi, Sendai, JP;

Assignee:

TOPCON CORPORATION, Itabashi-ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/14 (2013.01);
Abstract

An ophthalmological imaging device according to embodiments comprises an objective lens, an interference optical system, an optical scanner, a controller, and an image forming part. The interference optical system divides light from a light source into measurement light and reference light, causes the measurement light to become incident on a subject's eye via the objective lens, and detects interference light between the reference light and return light of the measurement light that has exited from the subject's eye and passed through the objective lens. The optical scanner deflects the measurement light. The controller controls the optical scanner such that a position away from an optical axis of the objective lens is set as a center to deflect the measurement light. The image forming part forms an image of the subject's eye based on a detection result of the interference light by the interference optical system.


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