The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Apr. 28, 2017
Applicant:
Basf Plant Science Company Gmbh, Ludwigshafen, DE;
Inventors:
Frederik Leyns, Oosterzele, BE;
Joris Eeckhout, Maarkedal, BE;
Assignee:
BASF PLANT SCIENCE COMPANY GMBH, Ludwigshafen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01H 3/04 (2006.01); G01N 33/00 (2006.01); G06T 7/00 (2017.01); G01N 33/50 (2006.01); A01G 7/00 (2006.01);
U.S. Cl.
CPC ...
A01H 3/04 (2013.01); A01G 7/00 (2013.01); G01N 33/0098 (2013.01); G01N 33/5097 (2013.01); G06T 7/0012 (2013.01); G06T 7/0016 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30004 (2013.01);
Abstract
The invention relates to a method and apparatus for evaluation of the effect of a treatment on one or more characteristics of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of the effect of a treatment on one or more characteristics of a plant.