The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Oct. 03, 2017
Applicant:

Tengyuan Zhang, London, CA;

Inventors:

Tengyuan Zhang, London, CA;

Jun Yang, London, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 3/10 (2006.01); H05K 3/46 (2006.01); H05K 1/02 (2006.01); H05K 1/03 (2006.01); H05K 1/09 (2006.01); H05K 3/12 (2006.01); B05D 1/26 (2006.01); B05D 5/12 (2006.01); B05D 7/00 (2006.01); B05D 3/00 (2006.01);
U.S. Cl.
CPC ...
H05K 3/4644 (2013.01); H05K 1/028 (2013.01); H05K 1/0373 (2013.01); H05K 1/092 (2013.01); H05K 3/1208 (2013.01); B05D 1/26 (2013.01); B05D 3/002 (2013.01); B05D 5/12 (2013.01); B05D 7/50 (2013.01); B05D 7/56 (2013.01); H05K 1/0393 (2013.01); H05K 3/125 (2013.01); H05K 3/1216 (2013.01); H05K 3/1275 (2013.01); H05K 2201/0145 (2013.01); H05K 2201/0154 (2013.01); H05K 2203/0126 (2013.01); H05K 2203/1157 (2013.01);
Abstract

A one-step react-on-demand (RoD) method for fabricating flexible circuits with ultra-low sheet resistance, enhanced safety and durability. With the special functionalized substrate, a real-time three-dimensional synthesize of silver plates in micro scale was triggered on-demand right beneath the tip in the water-swelled PVA coating, forming a three-dimensional metal-polymer (3DMP) hybrid structure of ˜7 μm with one single stroke. The as-fabricated silver traces show an enhanced durability and ultralow sheet resistance down to 4 mΩ/sq which is by far the lowest sheet resistance reported in literatures achieved by direct writing. Meanwhile, PVA seal small particles inside the film, adding additional safety to this technology. Since neither nanomaterials nor a harsh fabrication environment are required, the proposed method remains low-cost, user friendly and accessible to end-users. the RoD approach can be extended to various printing systems, offering a particle-free, sintering-free solution for high resolution, high speed production of flexible electronics.


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