The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

May. 11, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Hyoseok Hwang, Seoul, KR;

Juyong Park, Seongnam-si, KR;

Hyun Sung Chang, Seoul, KR;

Dong Kyung Nam, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/327 (2018.01); H04N 13/106 (2018.01); H04N 13/324 (2018.01); H04N 13/398 (2018.01); H04N 13/302 (2018.01);
U.S. Cl.
CPC ...
H04N 13/327 (2018.05); H04N 13/106 (2018.05); H04N 13/302 (2018.05); H04N 13/324 (2018.05); H04N 13/398 (2018.05);
Abstract

A method of determining a calibration parameter for a three-dimensional (3D) display device includes determining a calibration parameter for a 3D display device based on an image of a second pattern three-dimensionally converted from an image of a first pattern.


Find Patent Forward Citations

Hwang, Hyoseok. (2020). Method of determining calibration parameter for three-dimensional (3d) display device and 3d display device using the method (U.S. Patent No. 10771771). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10771771

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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