The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Aug. 07, 2017
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Norio Yamagaki, Tokyo, JP;
Hiroaki Aminaka, Tokyo, JP;
Dai Kanetomo, Tokyo, JP;
Yasuhiko Matsunaga, Tokyo, JP;
Gen Motoyoshi, Tokyo, JP;
Assignee:
NEC CORPORATION, Minato-ku, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 21/2662 (2011.01); H04N 19/167 (2014.01); H04N 21/24 (2011.01); H04N 21/2343 (2011.01); H04N 7/18 (2006.01); H04N 19/176 (2014.01); H04N 19/124 (2014.01); H04N 21/431 (2011.01); H04N 21/6547 (2011.01);
U.S. Cl.
CPC ...
H04N 7/181 (2013.01); H04N 7/18 (2013.01); H04N 7/183 (2013.01); H04N 19/124 (2014.11); H04N 19/167 (2014.11); H04N 19/176 (2014.11); H04N 21/234345 (2013.01); H04N 21/2402 (2013.01); H04N 21/2662 (2013.01); H04N 21/431 (2013.01); H04N 21/6547 (2013.01);
Abstract
A image processing apparatus according to an aspect of the present invention includes: determination unitthat determines a first region based on an occurrence position where a phenomenon is estimated to occur in an image; and setting unitthat sets a first condition in which the first region is encoded, and a second condition in which a second region included in the image and being a region other than the first region is encoded in such a way that the first region enhances image quality as compared with the second region.