The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Sep. 25, 2018
Applicant:
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Inventor:
Masaki Higurashi, Hachioji, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G02B 7/36 (2006.01); G02B 21/36 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/232123 (2018.08); G02B 7/36 (2013.01); G02B 21/365 (2013.01); G06K 9/00134 (2013.01);
Abstract
An observation device, comprising an image sensor that forms an image of a specimen, and a processor having a focus control section and an analyzer, wherein the focus control section, in a case where image data for analysis of the specimen by the analyzer is obtained when a plurality of maximum values have been generated for change in contrast evaluation value corresponding to change in the focus position, controls focus position any focus position that corresponds to the plurality of maximum values, and the image sensor outputs image data that has been imaged.