The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Jul. 13, 2018
Applicant:

Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;

Inventors:

Frank Wippermann, Meiningen, DE;

Andreas Brueckner, Jena, DE;

Andreas Reimann, Apolda/Sulzbach, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); H04N 5/232 (2006.01); H04N 13/239 (2018.01); G02B 13/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2258 (2013.01); G02B 13/0015 (2013.01); H04N 5/23212 (2013.01); H04N 5/23238 (2013.01); H04N 13/239 (2018.05);
Abstract

A multi-aperture imaging device includes at least one image sensor and an array of juxtaposed optical channels. Each optical channel includes optics for imaging of projecting at least one partial area of an object area on an image sensor area of the image sensor. A first optics of a first optical channel is configured to project a first partial area of the object area on a first image sensor area and to project a second partial area of the object area on a second image sensor area. A second optics of a second optical channel is configured to project at least a third partial area of the object area on a third image sensor area. The first partial area and the second partial area are disjoint in the object area. The third partial area overlaps incompletely with the first partial area.


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