The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Jan. 31, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Aaron K. Baughman, Cary, NC (US);

Richard A. Locke, Cary, NC (US);

Brian M. O'Connell, Cary, NC (US);

Brian J. Snitzer, Lancaster, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 12/911 (2013.01); G06F 9/455 (2018.01);
U.S. Cl.
CPC ...
H04L 43/16 (2013.01); G06F 9/45533 (2013.01); G06F 9/45558 (2013.01); H04L 43/08 (2013.01); H04L 43/0876 (2013.01); H04L 47/822 (2013.01); G06F 2009/4557 (2013.01); G06F 2009/45591 (2013.01); G06F 2009/45595 (2013.01);
Abstract

Approaches for monitoring performance in a networked environment are provided. An approach includes monitoring, using a first metric, performance of a first host running a virtual machine. The approach also includes determining, using a computer device, a second metric based on the virtual machine being migrated from the first host to a second host, wherein the second metric is a function of: (i) the first metric and (ii) a comparison of the first host and the second host. The approach further includes monitoring, using the second metric, performance of the second host running the virtual machine.


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