The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Feb. 17, 2017
Applicant:

Luxembourg Institute of Science and Technology (List), Esch-sur-Alzette, LU;

Inventor:

David Dowsett, Schuttrange, LU;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/06 (2006.01); G01N 23/2258 (2018.01); H01J 49/14 (2006.01);
U.S. Cl.
CPC ...
H01J 49/061 (2013.01); G01N 23/2258 (2013.01); H01J 49/142 (2013.01);
Abstract

The invention is directed to mass spectrometer comprising an extraction system for secondary ions. The system comprises: an inner spherical deflecting sector; an outer spherical deflecting sector; a deflecting gap formed between the sectors; a housing in which the sectors are arranged. The deflecting sectors are biased at retarding potentials in order to reduce the energy of the ion beam entering the deflecting gap. The system further comprises an exit disc electrode which is biased at the midvoltage of the average voltage of the sectors, and two side plates both facing the spherical sectors, the side plates being biased in order to create an electrostatic field perpendicular to the exit axis.


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