The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Feb. 24, 2017
Juntos, Inc., San Carlos, CA (US);
Christopher Benjamin Walker, San Francisco, CA (US);
Dante Emilio Cassanego, San Carlos, CA (US);
JUNTOS, INC., San Carlos, CA (US);
Abstract
An optimal sample size for experiments targeting units having specific static criteria is determined, based on one or more iterations of a performed experiment. The sample size to use for subsequent experiments targeting units having the specific static criteria is calculated based on target effect of the performed experiment. Multiple iterations can be performed to refine the sample size. Each iteration uses the previously calculated sample size as a parameter. The calculated sample size is then used to determine an optimal treatment. Separate experiments using separate treatments are performed on separate group sets of the calculated sample size. For each separate performed experiment, a score is calculated for the corresponding specific treatment, taking into account actual effect size, statistical significance and homogeneity of effect. Depending upon the score, the given treatment can be accepted for production usage or discarded, or the experiment can be replicated to validate effect.