The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Feb. 10, 2017
Applicant:

Cognex Corporation, Natick, MA (US);

Inventor:

Nathaniel R. Bogan, Natick, MA (US);

Assignee:

Cognex Corporation, Natick, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06K 9/62 (2006.01); G06K 9/48 (2006.01); G06K 9/46 (2006.01); G06T 7/33 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06K 9/4604 (2013.01); G06K 9/48 (2013.01); G06K 9/6204 (2013.01); G06K 9/6255 (2013.01); G06T 7/344 (2017.01); G06T 7/75 (2017.01); G06K 2209/19 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A system and method for scoring trained probes for use in analyzing one or more candidate poses of a runtime image is provided. A set of probes with location and gradient direction based on a trained model are applied to one or more candidate poses based upon a runtime image. The applied probes each respectively include a discrete set of position offsets with respect to the gradient direction thereof. A match score is computed for each of the probes, which includes estimating a best match position for each of the probes respectively relative to one of the offsets thereof, and generating a set of individual probe scores for each of the probes, respectively at the estimated best match position.


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