The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
May. 31, 2019
Siliconarts, Inc., Seoul, KR;
Hyung Min Yoon, Seoul, KR;
SILICONARTS, INC., Seoul, KR;
Abstract
Disclosed is a ray tracing device using MIMD based T&I scheduling, including: a ray receiving unit receiving a ray generated with respect to a specific frame according to a frame progress order and storing the received ray in a ray buffer; a ray scheduling unit allocating a ray provided by the ray buffer to one of a plurality of T&I pipelines, each of which including an input and output buffers; a traversal/intersection test performing unit performing a traversal/intersection test on an allocated ray in a parallel fashion by using each of the plurality of T&I pipelines and determining a triangle intersecting the allocated ray; and a test result ordering unit receiving information about the triangle from the plurality of T&I pipelines as a test result, storing the received test result in a test buffer, and re-arranging the received test result according to a frame progress order.