The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Nov. 29, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Brian P. Byrne, Austin, TX (US);

Sushain Pandit, Austin, TX (US);

Vijay Ekambaram, Chennai, IN;

Adam R. Holley, Austin, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 20/40 (2012.01); G06N 5/04 (2006.01); H04L 12/24 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
G06Q 20/4016 (2013.01); G06N 5/048 (2013.01); H04L 41/06 (2013.01); H04L 41/12 (2013.01); H04L 41/142 (2013.01); H04L 41/145 (2013.01); H04L 43/045 (2013.01); H04L 43/067 (2013.01); H04L 43/16 (2013.01);
Abstract

Methods and apparatus, including computer program products, implementing and using techniques for identifying pathways in a graph of interconnected nodes. A time series of graph data is captured, which corresponds to events occurring at different nodes in the graph. The graph is traversed to identify consistent and variable pathways, respectively, within the graph. The identified pathways are scored according to a particular feature to establish an expected variance model for the events contained within the graph. Newly received data are compared against the expected variance model to determine a degree to which the newly received data deviates from the expected variance. The variance model is adjusted based on the newly encountered data.


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