The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Oct. 10, 2018
Drvision Technologies Llc, Bellevue, WA (US);
Michael William Jones, Kenmore, WA (US);
Luciano Andre Guerreiro Lucas, Redmond, WA (US);
Hoyin Lai, Seattle, WA (US);
Casey James McBride, Kirkland, WA (US);
Shih-Jong James Lee, Bellevue, WA (US);
DRVISION TECHNOLOGIES LLC, Bellevue, WA (US);
Abstract
A computerized automated parameterization image pattern detection and classification method performs (1) morphological metrics learning using labeled region data to generate morphological metrics; (2) intensity metrics learning using learning image and labeled region data to generate intensity metrics; and (3) population learning using the morphological metrics and the intensity metrics to generate learned pattern detection parameter. The method may further update the learned pattern detection parameter using additional labeled region data and learning image, and apply pattern detection with optional user parameter adjustment to image data to generate detected pattern. The method may alternatively perform pixel parameter learning and pixel classification to generate pixel class confidence, and uses the pixel class confidence and the labeled region data to perform pattern parameter learning to generate the learned pattern detection parameter. The method may further perform pattern classification learning to generate pattern classifier which is used to generate classified pattern.