The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Mar. 29, 2013
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Lirong Jian, Beijing, CN;

Lei Chang, Beijing, CN;

Zhanwei Wang, Beijing, CN;

Tao Ma, Beijing, CN;

Luke Lonergan, San Carlos, CA (US);

Lili Ma, Beijing, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 16/2453 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24542 (2019.01);
Abstract

Data location-based query optimization for scan operators in a large-scale distributed database system is disclosed. In various embodiments, a set of query processing segments to be used to process a query is identified. It is determined for each of a plurality of data blocks to be scanned to process the query a corresponding storage location in which the data block is stored in a distributed storage system. Each of the plurality of data blocks is assigned to be scanned by a query processing segment selected based at least in part on a location of the query processing segment relative to the corresponding storage location in which the data block is stored.


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