The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Feb. 26, 2018
The Ultimate Software Group, Inc., Weston, FL (US);
John A. Maliani, Pembroke Pines, FL (US);
Robert L. Vanderwall, Weston, FL (US);
Michael L. Mattera, Coral Springs, FL (US);
Dionny Santiago, Weston, FL (US);
Brian R. Muras, Weston, FL (US);
Keith A. Briggs, Coral Springs, FL (US);
David Adamo, Sunrise, FL (US);
Tariq King, Pembroke Pines, FL (US);
The Ultimate Software Group, Inc., Weston, FL (US);
Abstract
A system for autonomously testing a computing system is disclosed. The system parses data obtained from a variety of sources, and extracts source concepts from the parsed data to generate models for inclusion in a set of agglomerated models. The system interacts with and explores features of a software application being tested by the system. Outputs and information obtained from the interaction are utilized by the system to update the models or generate new models for the set of agglomerated models. The agglomerated models are utilized by the system to execute tests on the application to detect potential defects and conflicts. Detected defects and conflicts may be included in a report for review. Feedback on the defects and conflicts may be utilized to further update the agglomerated models. The agglomerated models are updated recursively as additional data is obtained, further interactions are performed, and further outputs are generated over time.