The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Aug. 23, 2018
Applicant:

Arm Limited, Cambridge, GB;

Inventors:

Peter Uttley, Nottingham, GB;

Kar Lik Kasim Wong, Wokingham, GB;

Assignee:

Arm Limited, Cambridge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/12 (2006.01); G06F 11/16 (2006.01); G06F 1/06 (2006.01); H04J 3/06 (2006.01); H04L 12/26 (2006.01); G04G 7/00 (2006.01); H04W 56/00 (2009.01);
U.S. Cl.
CPC ...
G06F 11/1604 (2013.01); G06F 1/06 (2013.01); G06F 1/12 (2013.01); G04G 7/00 (2013.01); H04J 3/0638 (2013.01); H04J 3/0644 (2013.01); H04L 43/0852 (2013.01); H04L 43/0858 (2013.01); H04W 56/001 (2013.01);
Abstract

Apparatus comprises master counter circuitry to generate a master count signal in response to a clock signal; slave counter circuitry responsive to the clock signal to generate a respective slave count signal, the slave counter circuitry having associated fault detection circuitry; and a synchronisation connection providing signal communication between the master counter circuitry and the slave counter circuitry, the master counter circuitry being configured to provide via the synchronisation connection: initialisation data at an initialisation operation; and fault detection data at a fault detection operation; the initialisation data and subsequent fault detection data each representing respective indications of a state of the master count signal; the slave counter circuitry being configured, during an initialisation operation for that slave counter circuitry, to initialise a counting operation of that slave counter circuitry in response to the initialisation data provided by the master counter circuitry; and the fault detection circuitry associated with the slave counter circuitry being configured, during a fault detection operation for that slave counter circuitry, to detect whether a counting operation of that slave counter circuitry generates a slave count signal which is within a threshold count difference of a fault detection count value dependent upon the fault detection data provided by the master counter circuitry.


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