The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Oct. 18, 2018
Systems and methods for selectively instrumenting a program according to performance characteristics
Denso International America, Inc., Southfield, MI (US);
Ameer Kashani, Southfield, MI (US);
Gopalakrishnan Iyer, Santa Clara, CA (US);
Denso International America, Inc., Southfield, MI (US);
Abstract
System, methods, and other embodiments described herein relate to determining performance overhead for instrumentation within a program. In one embodiment, a method includes, in response to compiling the program from source code into machine code, analyzing the program to generate overhead scores associated with segments of instrumentation within separate functions of the program. The instrumentation is combined with the source code to provide functionality in addition to a base functionality of the program. The method includes selectively modifying the segments in the source code for the separate functions according to whether the overhead scores for respective ones of the segments satisfies an instrumentation threshold associated with respective ones of the separate functions.