The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Jan. 29, 2018
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Jinghui Li, Shenzhen, CN;

Jindong Zhang, Shenzhen, CN;

Cheng Huang, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0611 (2013.01); G06F 3/0653 (2013.01); G06F 3/0689 (2013.01); G06F 11/22 (2013.01); G06F 11/3034 (2013.01); G06F 11/3419 (2013.01); G06F 11/3485 (2013.01);
Abstract

The present invention provides a disk detection method and apparatus. The method includes: collecting a set of N pieces of real-time data that are in a one-to-one correspondence with N input/output I/O-related counters of a disk, where the N I/O-related counters include an I/O response time of the disk and a counter affecting the I/O response time; the I/O response time is a time between delivery of an operation request by an application and reception of a response of the disk to the request; determining, according to the N pieces of real-time data, whether the I/O response time is abnormal; and outputting a detection result if the I/O response time is abnormal, where the detection result is used to represent that the I/O response time is abnormal.


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