The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Apr. 12, 2016
Hewlett Packard Enterprise Development Lp, Houston, TX (US);
Gurunatha Karaje, San Jose, CA (US);
Mandar Samant, San Jose, CA (US);
Sourabh Yerfule, San Jose, CA (US);
Zhaosheng Zhu, Sunnyvale, CA (US);
Vanco Buca, San Jose, CA (US);
Hewlett Packard Enterprise Development LP, Houston, TX (US);
Abstract
Methods, systems, and programs are presented for controlling the flow of data into a device in the presence of writes that are unaligned along boundaries associated with a block size. One method includes operations for identifying admission data rates for volumes, and for tracking a utilization rate of a memory that stores data of incoming writes. The method determines if incoming writes include unaligned data. When the memory utilization rate is above a first threshold, a first flow control is applied that includes a reduction of admission rates of volumes having unaligned writes while maintaining admission rates of volumes without unaligned writes. When the utilization rate is above a second threshold that is greater than the first threshold, a second flow control is applied in addition to the first flow control. The second flow control includes a reduction of a system admission rate for all incoming writes.