The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Aug. 13, 2018
Applicant:
Mikron Agie Charmilles Ag, Nidau, CH;
Inventors:
Assignee:
GF MACHINING SOLUTIONS AG, , CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/404 (2006.01); G05B 19/4065 (2006.01); B23Q 17/09 (2006.01); G01B 11/00 (2006.01); G05B 19/406 (2006.01);
U.S. Cl.
CPC ...
G05B 19/404 (2013.01); B23Q 17/0985 (2013.01); G01B 11/007 (2013.01); G05B 19/406 (2013.01); G05B 19/4065 (2013.01); B23Q 2717/006 (2013.01); G05B 2219/37001 (2013.01); G05B 2219/37008 (2013.01); G05B 2219/37027 (2013.01); G05B 2219/37043 (2013.01); G05B 2219/37428 (2013.01);
Abstract
A method for using a geometrical probe () with a spindle () of a machine tool (), wherein a probe fetch waiting state of the machine tool (), at least one temperature parameter related to a temperature of the spindle () of the machine tool () is determined by measuring at least one temperature value for the spindle (), and time for fetching the geometrical probe () is determined depending on the at least one temperature parameter.
Meier, Jonas. (2020). Method for using a geometrical probe with a spindle of a machine tool, and machine tool configured to carry out such a method (U.S. Patent No. 10768604). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10768604
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