The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Oct. 02, 2018
Applicant:

Fanuc Corporation, Minamitsuru-gun, Yamanashi, JP;

Inventors:

Yamato Iwamura, Yamanashi, JP;

Shinichirou Itakura, Yamanashi, JP;

Ryuta Hitomi, Yamanashi, JP;

Assignee:

Fanuc Corporation, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/402 (2006.01); G05B 19/404 (2006.01);
U.S. Cl.
CPC ...
G05B 19/402 (2013.01); G05B 19/404 (2013.01); G05B 2219/37336 (2013.01); G05B 2219/50063 (2013.01); G05B 2219/50074 (2013.01);
Abstract

A numerical controller for correcting a deviation amount corresponding to a difference between a theoretical value and a measured value of a workpiece includes a machining unit for storing a machining path of the workpiece and an effective offset number during machining of the machining path in association with each other, a measurement unit for storing a deviation amount applied to the workpiece and a measurement point at which the deviation amount is detected in association with each other, and a correction unit for reflecting the deviation amount to the offset number corresponding to the machining path around the measurement point.


Find Patent Forward Citations

Iwamura, Yamato. (2020). Numerical controller capable of correcting a deviation amount of a workpiece (U.S. Patent No. 10768603). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10768603

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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