The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Aug. 03, 2018
Facebook Technologies, Llc, Menlo Park, CA (US);
Matthieu Charles Raoul Leibovici, Seattle, WA (US);
Kavous Jorabchi, Redmond, WA (US);
Austin Lane, Redmond, WA (US);
Facebook Technologies, LLC, Menlo Park, CA (US);
Abstract
A monitoring system monitors changes in an index of refraction of the grating over a time interval that includes the period of time. The monitoring system includes a light source assembly, a probing assembly, a power meter (e.g., a diffraction and/or a transmittance power meter), and a controller. The light source assembly emits a probe beam. The scanning assembly scans the probe beam over an area of the grating. The power meter measures power of a portion of the probe beam that interacts (e.g., is transmitted by or diffracted from) with the area of the grating. The controller determines changes in grating parameters (may be as a function of time) for the grating being formed based in part on measured power readings over the time interval.