The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Nov. 19, 2018
Photo Diagnostic Systems, Inc., Boxboro, MA (US);
Bernard M. Gordon, Manchester, MA (US);
Olof Johnson, Ashburnham, MA (US);
Photo Diagnostic Systems, Inc., Boxboro, MA (US);
Abstract
A method for scanning an object in an X-ray security inspection system, wherein the X-ray security inspection system comprises an ingoing tunnel equipped with radiation-shielding curtains, an X-ray section and an outgoing tunnel equipped with radiation-shielding curtains, the method comprising: passing the object through the ingoing tunnel at a first rate of speed and with a first extent of separation between successive objects; passing the object through the X-ray section at a second rate of speed and with a second extent of separation between successive objects; and passing the object through the outgoing tunnel at a third rate of speed and with a third extent of separation between successive objects; wherein the second rate of speed is less than the first rate of speed and the third rate of speed, and wherein the second extent of separation between successive objects is less than the first extent of separation between successive objects and the third extent of separation between successive objects.