The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Oct. 06, 2014
Samsung Electronics Co., Ltd., Suwon-si, KR;
Hwan Shim, Yongin-si, KR;
Young-tae Kim, Seongnam-si, KR;
Hyung-joon Lim, Seoul, KR;
Yun-sub Jung, Yongin-si, KR;
Byeong-geun Cheon, Anyang-si, KR;
Min-Gu Lee, Hwaseong-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
A method for obtaining an elastic feature of an object includes inducing a first shear wave in the object by transmitting a first push ultrasound signal which is generated by a probe of an ultrasound apparatus and a first grating lobe signal which relates to the first push ultrasound signal toward the object, transmitting a tracking ultrasound signal to an area of the object where the first shear wave has propagated, receiving, from the object, a reflection signal which relates to the tracking ultrasound signal, measuring a first shear wave parameter which indicates a shear wave characteristic of the first shear wave based on the reflection signal, and obtaining an elastic feature of the object by using the first shear wave parameter.