The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Mar. 08, 2019
Advanced Micro Devices, Inc., Santa Clara, CA (US);
Venkat Krishnan Ravikumar, Singapore, SG;
Wen Tsann Lua, Singapore, SG;
Gopinath Ranganathan, Singapore, SG;
Yi Xuan Seah, Singapore, SG;
Shei Lay Phoa, Singapore, SG;
Nathan Linarto, Singapore, SG;
Jiann Min Chin, Singapore, SG;
Advanced Micro Devices, Inc., Santa Clara, CA (US);
Abstract
A control system for placing an optic probe includes a receiver circuit that receives reflected light produced from the optic probe and provides a laser probe (LP) waveform of the reflected light in response to an activation of a trigger signal. A combinational logic analysis (CLA) processor provides a CLA waveform in response to simulating an optical response at a target location on a surface of a cell of a device under test to a test pattern. A test controller receives the CLA waveform and the LP waveform, and has a first output for providing the trigger signal, a second output for providing the test pattern, and a third output for providing a position signal. The test controller updates the position signal to move the optic probe closer to the target location according to a degree of fit between the LP waveform and the CLA waveform.