The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Mar. 15, 2018
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Vincent Abadie, Höhenschäftlarn, DE;

Corbett Rowell, Munich, DE;

Edwin Menzel, Munich, DE;

Axel Meier, Wolnzach, DE;

Niels Petrovic, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01R 29/08 (2006.01); H04W 24/08 (2009.01); H04B 17/00 (2015.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); G01R 29/0821 (2013.01); G01R 29/0878 (2013.01); H04B 17/0085 (2013.01); H04W 24/08 (2013.01);
Abstract

The present invention provides a test arrangement and test method for testing a wireless device under test. A first antenna may be arranged at a first distance from the device under test, and a second antenna may be arranged at a second distance from the device under test. In particular, the second antenna may be arranged closer to the device under test and the first antenna. Physical parameters characterizing the transmission properties between the individual antenna and the device under test are determined for the first and the second antenna. Test of the device under test is performed employing the second antenna, wherein the signals are rescaled based.


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