The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Sep. 08, 2017
Oz Optics Ltd., Ottawa, CA;
Safieddin Safavi-Naeini, Waterloo, CA;
Shahed Shahir, Waterloo, CA;
OZ Optics Limited, Ottawa, CA;
Abstract
A multi-view planar near-field scattering tomography system is provided herein. In one aspect the system is developed based on the reformulated signal subspace approach. Utilized for solving the electromagnetic inverse scattering problem, the signal subspace approach is reformulated. The present invention pertains to a computationally efficient approach to an electromagnetic inverse scattering-based permittivity profile estimation technique. In a second aspect, the system is developed at the millimeter-wave and THz frequency range to ensure accuracy by eliminating the multipath effects and without the need for an Anechoic chamber or water as a background medium for clinical, security, and manufacturing applications.