The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Aug. 27, 2019
Raytheon Company, Waltham, MA (US);
Lacy G. Cook, El Segundo, CA (US);
RAYTHEON COMPANY, Waltham, MA (US);
Abstract
All-reflective optics for use in imaging spectrometers. In one example, an imaging spectrometer includes an entrance slit and spectrometer optics consisting of a primary mirror, a secondary mirror having a diffraction grating formed thereon, and a tertiary mirror, each of the primary mirror, the secondary mirror, and the tertiary mirror having free-form non-rotationally symmetric surface figures defined by Zernike polynomials. The spectrometer optics are configured to receive the telecentric image at the entrance slit, to disperse the optical radiation into its spectral components to provide dispersed optical radiation, and to focus the dispersed optical radiation onto an image plane positioned in a common plane with the entrance slit. The spectrometer optics have a physical length that is twice the length of the entrance slit, a ratio of a distance of the secondary mirror from the entrance slit to a distance of the primary mirror from the entrance slit being approximately 0.32.