The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Oct. 19, 2017
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Bernd Georgi, Oberkochen, DE;
Josef Wanner, Oberkochen, DE;
Roland Froewis, Oberkochen, DE;
Hubert Lettenbauer, Essingen, DE;
CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH, Oberkochen, DE;
Abstract
A CMM has a measuring head for recording measurement values associated with an object having a plurality of geometric elements. Defined geometric elements are selected from the plurality of geometric elements and test features relating to the defined geometric elements are determined depending on demand data provided for the geometric elements. Initially, a first measurement sequence including first control commands for controlling the measuring head are determined depending on the test features. The first measurement sequence is modified before the individual measurement values are recorded in order to obtain a second measurement sequence with second control commands, which differ from the first control commands. The second control commands are used for controlling the measuring head and are selected so that the measurement results at the selected geometric elements each have a defined measurement uncertainty that is smaller, by a defined absolute value, than acceptable manufacturing tolerances for the geometric elements.