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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10766784 B1

PDFFull Text
Date of Patent:
Sep. 08, 2020

Filed:

Dec. 25, 2018

Method of manufacturing semiconductor material from mayenite

Applicant:

Wuhan University, Wuhan, CN;

Inventors:

Shengwen Tang, Wuhan, CN;

Wenzhi Yu, Wuhan, CN;

Wei Zhou, Wuhan, CN;

Yang Li, Wuhan, CN;

Hubao A, Wuhan, CN;

Assignee:

WUHAN UNIVERSITY, Wuhan, CN;

Attorneys:

Matthias Scholl P.C.

Matthias Scholl

Primary Examiner:

Steven J Bos

Int. Cl.
CPC ...
C01F 17/00 (2020.01); C01F 7/16 (2006.01); C30B 13/34 (2006.01); C30B 15/36 (2006.01); C30B 29/20 (2006.01);
U.S. Cl.
CPC ...
C01F 7/164 (2013.01); C30B 13/34 (2013.01); C30B 15/36 (2013.01); C30B 29/20 (2013.01); C01P 2002/72 (2013.01); C01P 2004/02 (2013.01); C01P 2004/03 (2013.01); C01P 2004/80 (2013.01); C01P 2006/40 (2013.01);
Abstract

A method of preparation of semiconductor material. The method includes: adding an organic substance containing a benzene ring and dodecacalcium hepta-aluminate (12CaO.7AlOor C12A7) to a test tube, and sealing the test tube; heating the test tube to a temperature of 200-300° C., and holding the temperature for 1 to 3 hours; and continuously heating the test tube to a temperature of 900-1300° C., and holding the temperature for 10-120 hours.

Find Patent Forward Citations

Tang, Shengwen. (2020). Method of manufacturing semiconductor material from mayenite (U.S. Patent No. 10766784). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10766784

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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