The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Jan. 06, 2020
Applicant:

Bertec Limited, Edinburgh, GB;

Inventors:

Necip Berme, Worthington, OH (US);

Sasan Ghassab, Columbus, OH (US);

Mohan Chandra Baro, Columbus, OH (US);

Assignee:

Bertec Limited, Edinburgh, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/00 (2006.01); A63F 13/218 (2014.01); G01P 15/02 (2013.01); G01L 1/22 (2006.01); A63F 13/211 (2014.01); A63F 13/213 (2014.01); A63F 13/23 (2014.01); A63F 13/80 (2014.01); A61B 5/11 (2006.01); A61B 5/00 (2006.01); G01C 19/00 (2013.01);
U.S. Cl.
CPC ...
A63F 13/218 (2014.09); A61B 5/1117 (2013.01); A61B 5/1128 (2013.01); A61B 5/7264 (2013.01); A63F 13/211 (2014.09); A63F 13/213 (2014.09); A63F 13/23 (2014.09); A63F 13/80 (2014.09); G01C 19/00 (2013.01); G01L 1/2206 (2013.01); G01L 1/2268 (2013.01); G01P 15/02 (2013.01); A61B 2562/0219 (2013.01); A61B 2562/0247 (2013.01); A63F 2300/105 (2013.01); A63F 2300/1025 (2013.01); A63F 2300/1062 (2013.01); A63F 2300/1068 (2013.01); A63F 2300/1087 (2013.01);
Abstract

A force measurement system is disclosed herein. In one embodiment, the system includes a force measurement assembly configured to receive a subject; a data processing device operatively coupled to the force measurement assembly, the data processing device configured to determine a center of pressure for the subject using output forces and/or moments from the force measurement assembly; and a mobile device configured to determine one or more parameters indicative of the body sway for the subject. In this embodiment, a fall risk of the subject is assessed based upon a combination of the center of pressure and the one or more parameters indicative of the body sway determined for the subject.


Find Patent Forward Citations

Berme, Necip. (2020). Force measurement system (U.S. Patent No. 10765936). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10765936

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…