The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Mar. 05, 2018
Photono Oy, Helsinki, FI;
Edward Haeggström, Helsinki, FI;
Ari Salmi, Helsinki, FI;
Ivan Kassamakov, Helsinki, FI;
Heikki Nieminen, Helsinki, FI;
Timo Rauhala, Helsinki, FI;
Kalle Hanhijärvi, Helsinki, FI;
Antti Kontiola, Helsinki, FI;
PHOTONO OY, Helsinki, FI;
Abstract
An intraocular pressure measurement arrangement is disclosed for measuring pressure of an eye of a patient. The arrangement can detect at least one of acoustic reflectivity, optical reflectivity, optical path difference, positioning of intraocular pressure measurement arrangement with respect to the eye, orientation of intraocular pressure measurement arrangement with respect to the eye, shape of cornea and corneal thickness. At least one source can produce acoustic, nonlinear acoustic, mechanical or a nonlinear mechanical wave from a distance, coupling to the eye to generate at least one surface wave. Upon triggering data acquisition, at least one surface wave from a distance from the eye can be detected to extract surface wave information with pressure information of the eye being based on the surface wave information.