The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Apr. 25, 2018
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Assignee:
Shimadzu Corporation, Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto-shi, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/00 (2006.01); G06T 7/00 (2017.01); G06T 3/40 (2006.01); G06T 7/246 (2017.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5205 (2013.01); A61B 6/487 (2013.01); A61B 6/503 (2013.01); G06T 3/403 (2013.01); G06T 7/0014 (2013.01); G06T 7/246 (2017.01); A61B 6/0492 (2013.01); A61B 6/504 (2013.01); G06T 2207/10121 (2013.01); G06T 2207/30048 (2013.01); G06T 2207/30204 (2013.01);
Abstract
This X-ray imaging apparatus is equipped with an image processing unit. The image processing unit obtains a first image with a marker reference position set in a first X-ray image and generate a second image in which a virtual marker image is superimposed at a corresponding position in a second X-ray image reflecting the change of a relative position from the marker reference position with respect to the second X-ray image different from the first X-ray image.