The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Oct. 31, 2012
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Sawa Fuke, Kanagawa, JP;

Takuji Suzuki, Kanagawa, JP;

Kenta Cho, Kanagawa, JP;

Assignee:

TDK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/11 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/112 (2013.01); A61B 5/1117 (2013.01); A61B 5/6823 (2013.01); A61B 2562/0219 (2013.01);
Abstract

According to an embodiment, a gait analysis device includes a measuring unit configured to measure a subject's motion; a determining unit configured to determine a walking start point in time at which the subject starts walking based on the subject's motion; a feature quantity calculator configured to, when the walking start point in time is determined, calculate a feature quantity of the subject's motion measured during a predetermined time period starting from the walking start point in time as a time period in which the subject's motion is not stabilized; and an estimating unit configured to estimate a subject's walking condition based on the feature quantity.


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