The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Oct. 29, 2018
Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventor:

Takashi Ozaki, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); G16H 30/20 (2018.01); A61B 5/00 (2006.01); G16H 10/60 (2018.01); G16H 10/40 (2018.01); G16H 30/40 (2018.01); G16H 40/60 (2018.01); A61B 1/04 (2006.01);
U.S. Cl.
CPC ...
A61B 1/00009 (2013.01); A61B 1/04 (2013.01); A61B 5/0035 (2013.01); G16H 10/40 (2018.01); G16H 10/60 (2018.01); G16H 30/20 (2018.01); G16H 30/40 (2018.01); G16H 40/60 (2018.01); A61B 5/72 (2013.01);
Abstract

A processor includes: a generation unit that generates first-performed-examination identification information in correlation with reserved-examination identification information and generates second-performed-examination identification information in correlation with the reserved-examination identification information, the first-performed-examination identification information being for identifying a first performed examination, the second-performed-examination identification information being for identifying a second performed examination; a recording medium that records a first-performed-examination result accompanied by the first performed-examination identification information and a second-performed-examination result accompanied by the second performed-examination identification information; and a memory that records first count information and second count information, the first count information being related to the number of pieces of data obtained in the first performed examination and associated with the first-performed-examination identification information, the second count information being related to the number of pieces of data obtained in the second performed examination and associated with the second-performed-examination identification information.


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