The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Mar. 22, 2016
Applicant:

Sensormatic Electronics, Llc, Boca Raton, FL (US);

Inventors:

Anthony Burke, Noblesville, IN (US);

Peter Joseph Birkel, Noblesville, IN (US);

Assignee:

Sensormatic Electronics, LLC, Boca Raton, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
H04N 7/181 (2013.01); H04N 5/23206 (2013.01); H04N 5/23222 (2013.01); H04N 5/23296 (2013.01);
Abstract

A system and method for determining relationships between fields of views of surveillance cameras is disclosed. In the system, a user device such as a mobile phone receives image data from the cameras, and an analytics system of the user device analyzes the image data to determine the relationships between the fields of views of the surveillance cameras. The relationships include overlap among fields of view of at least two of the cameras and deadzones, where deadzones are areas monitored by the cameras that are not included within any of the fields of view of any of the cameras. In a preferred embodiment, the surveillance cameras capture image data of a scene while an installer holding the user device walks one or more critical paths through the scene. The user device then analyzes image data from the cameras during the critical path definition to determine any overlap and/or deadzones.


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