The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Aug. 28, 2018
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-Do, KR;

Inventors:

Manjit Hota, Bangalore, IN;

Puneet Pandey, Bangalore, IN;

Sachin Kumar Tiwari, Bangalore, IN;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Suwon-si, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/50 (2017.01); G06K 9/00 (2006.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
G06T 7/50 (2017.01); G06K 9/00201 (2013.01); G06T 7/60 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10028 (2013.01);
Abstract

Embodiments herein provide methods and systems for providing selective disparity refinement. The embodiments include detecting objects of interest of type similar to a type of a point of interest in an image. Disparity values may be determined for the point of interest and the objects of interest in the captured image. Objects of interest may be selected with disparity values within a disparity value threshold range, wherein the disparity value threshold range is based on disparity value of the point of interest. The embodiments include performing a redistribution of disparity values of objects in the image with disparity values not within the disparity value threshold range. The embodiments include assigning a disparity value to the selected objects of interest based on the disparity value of the point of interest, to achieve selective disparity refinement.


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