The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Aug. 15, 2019
Applicant:

Kyocera Document Solutions Inc., Osaka, JP;

Inventors:

Hiroko Sugimoto, Osaka, JP;

Yukari Kida, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06K 15/10 (2006.01); G06K 15/02 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06K 15/022 (2013.01); G06K 15/102 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30124 (2013.01); G06T 2207/30144 (2013.01);
Abstract

A fabric inspection device includes a sheet conveying portion, an image reading portion, a timing control portion, a storage portion, a comparing control portion, and a display portion. The image reading portion reads a plurality of images of the same pattern recorded repeatedly with a predetermined pitch on a recording sheet conveyed by the sheet conveying portion. The timing control portion regulates the timing of image reading by the image reading portion. The storage portion stores the plurality of images read by the image reading portion. The comparing control portion takes, out of the plurality of images stored in the storage portion, part of an image continuously recorded on the recording sheet corresponding to the forefront one pitch as a reference image and compares the image data of a comparison image recorded later than the reference image with image data of the reference image to check for image defects.


Find Patent Forward Citations

Loading…