The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Aug. 23, 2016
Yuyama Mfg. Co., Ltd., Toyonaka-shi, Osaka, JP;
Hiroyuki Yuyama, Toyonaka, JP;
Hirokazu Amano, Toyonaka, JP;
YUYAMA MFG, CO., LTD., Toyonaka-Shi, Osaka, JP;
Abstract
Provided is an inspection apparatus, an inspection method and a computer program product which can easily remove an improper target object. An inspection apparatus () includes a base () for placing target objects thereon, a photographing part () which can photograph the target objects placed on the base (), an inspection part for performing an inspection for the target objects placed on the base () based on an image photographed by the photographing part (), and a distinguishing process part for performing a process of making a specific target object placed on the base () visually distinguishable from other target objects placed on the base () based on a result of the inspection performed by the inspection part.