The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Mar. 01, 2019
Amazon Technologies, Inc., Seattle, WA (US);
Sergey Parshin, Redcliffe, AU;
Jon R. Ducrou, West End, AU;
Bradley Nathaniel Gray, Auchenflower, AU;
Ryan David Hapgood, Belmont, AU;
Matthew Lake, The Gap, AU;
Muthu Pandian Shanmugarajan, Greenslopes, AU;
Jeanette Rogers, Mount Gravatt East, AU;
Uladzimir Silchanka, Boondall, AU;
Yeyang Yu, Logan Central, AU;
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
A system that performs self-calibration for tracking packages includes a frame providing storage locations for storing items, radio frequency identification (RFID) tags disposed in the storage locations, and an RFID antenna(s). The system determines a distance between each RFID tag and the RFID antenna(s) and monitors signal characteristics from each RFID tag. For each RFID tag, the system generates (i) at least one first parameter indicative of an environmental condition(s) at a location of the RFID tag and (ii) at least one second parameter indicative of a response rate behavior of the RFID tag, based on the signal characteristics and the distance between the RFID tag and the RFID antenna(s). The system tracks an RFID tagged item located in one of the storage locations based at least in part on the first and second parameter(s) for each of the RFID tags.