The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Nov. 06, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Hua Wei Fan, Beijing, CN;

Lei Wang, Beijing, CN;

Zheng Lei An, Beijing, CN;

Xin Zhao, Changping District, CN;

Hong Wei Sun, Beijing, CN;

Ting Yin, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06K 7/14 (2006.01); G06K 19/06 (2006.01);
U.S. Cl.
CPC ...
G06K 7/1456 (2013.01); G06K 7/1417 (2013.01); G06K 19/06037 (2013.01);
Abstract

Examples of techniques for quick response (QR) code deformation are described herein. An aspect includes receiving a first QR code, wherein the first QR code is scannable by a QR code scanner at a first range of angles. Another aspect includes determining a scanner angle, the scanner angle being outside of the first range of angles. Another aspect includes generating a second QR code based on the first QR code and the scanner angle, wherein the second QR code comprises a deformed QR code that is scannable by the QR code scanner at a second range of angles that is distinct from the first range of angles.


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