The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Mar. 30, 2018
Applicant:

Wipro Limited, Bangalore, IN;

Inventors:

Girish Raghavan, Chennai, IN;

Selvan Nagaraja, Bangalore, IN;

Ganesh Narayan, Bangalore, IN;

Thamilchelvi Peterbarnabas, Chennai, IN;

Assignee:

Wipro Limited, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 11/3672 (2013.01); G06F 11/3684 (2013.01); G06F 11/3688 (2013.01);
Abstract

A method and device for automating testing based on context parsing across multiple technology layers is disclosed. The method includes clustering a plurality of test instructions into a plurality of technology groups based on an analysis of the plurality of test instructions. The method further includes creating an automation component for a set of test instructions in each of the plurality of technology groups, based on actions and objects in an associated set of test instructions. Further, the method includes identifying for each technology group a context information to be passed from an automation component associated with a technology layer to a downstream automation component associated with a succeeding technology layer, based on Natural Language Processing of the plurality of test instructions, and executing testing of the application based on the automation component and the associated context information.


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Raghavan, Girish. (2020). Method and device for automating testing based on context parsing across multiple technology layers (U.S. Patent No. 10761971). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10761971

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