The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Jun. 26, 2019
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Abhishek Sharma, Jaipur, IN;

Kapil Kumar Gupta, Gurgaon, IN;

Jayanthi Mohanram, Bangalore, IN;

Mani Gupta, Fursungi, IN;

Prateek Shah, Birmingham, GB;

Rohit Anand, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01); G06Q 10/06 (2012.01); G06F 16/21 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3608 (2013.01); G06F 11/3692 (2013.01); G06F 16/214 (2019.01); G06Q 10/0631 (2013.01);
Abstract

A device may receive, from a user device, a request for a code assessment of a proposed change to an enterprise resource planning (ERP) system of an organization to identify an impact of implementing the proposed change on custom code associated with the ERP system. The device may obtain data identifying custom items associated with the custom code from a data structure associated with the ERP system. The device may generate custom code metadata for the custom items by performing error checks to determine whether the custom items will cause errors after the proposed change is implemented. The device may generate an assessment report for the code assessment by processing the custom code metadata. The device may provide the assessment report for display on an interface of the user device, and may perform actions to permit the proposed change to be implemented without the errors occurring.


Find Patent Forward Citations

Sharma, Abhishek. (2020). Code assessment platform (U.S. Patent No. 10761960). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10761960

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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