The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2020
Filed:
Sep. 22, 2017
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Michael Milirud, Redmond, WA (US);
Zaki Maksyutov, Carnation, WA (US);
Bin Du, Redmond, WA (US);
Yi Jun Liu, Renton, WA (US);
Iuliia Safarova, Bothell, WA (US);
MICROSOFT TECHNOLOGY LICENSING, LLC, Redmond, WA (US);
Abstract
A system includes presentation of a first visualization of a first set of the plurality of samples on the display device, each sample of the first set associated with a time within a first time period, and the first visualization plotting a time against a metric value for each sample of the first set, presentation of a first histogram of the first set on the display device, the first histogram indicating, for each of a first plurality of metric categorizations, a number of samples of the first set associated with the metric categorization. Changing of the first period to a second time period results in cross-synchronization of the visualizations with a second set of data samples associated with the second time period. A first sample of the first set and associated with a first metric categorization may be identified as associated with a first stored event trace, where the first visualization presents a first indicator in association with the first metric categorization and which indicates the first stored event trace.